2013 Third International Conference on Advanced Computing & Communication Technologies (ACCT 2013) (2013)
April 6, 2013 to April 7, 2013
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ACCT.2013.52
This paper presents the improved perturbation based model of Holloway & Kuester for conductor loss computation. The model presented takes into account the frequency dependent nature of conductivity of thin film conductor. We have also shown comparison of Present model with experimental results for the frequency range 1 to 100 GHz. Deviations of the improved model from experimental are found below 9%.
conductors (electric), microstrip lines, millimetre wave devices, thin film devices
R. Bansal, P. Singh and A. Verma, "Experimental Verification of Conductor Loss Model for Thin Film Microstrip Line," 2013 Third International Conference on Advanced Computing & Communication Technologies (ACCT 2013)(ACCT), Rohtak, 2013, pp. 208-210.