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2013 Third International Conference on Advanced Computing & Communication Technologies (ACCT 2013) (2013)
Rohtak
April 6, 2013 to April 7, 2013
ISSN: 2327-0632
ISBN: 978-1-4673-5965-8
pp: 208-210
ABSTRACT
This paper presents the improved perturbation based model of Holloway & Kuester for conductor loss computation. The model presented takes into account the frequency dependent nature of conductivity of thin film conductor. We have also shown comparison of Present model with experimental results for the frequency range 1 to 100 GHz. Deviations of the improved model from experimental are found below 9%.
INDEX TERMS
conductors (electric), microstrip lines, millimetre wave devices, thin film devices
CITATION

R. Bansal, P. Singh and A. Verma, "Experimental Verification of Conductor Loss Model for Thin Film Microstrip Line," 2013 Third International Conference on Advanced Computing & Communication Technologies (ACCT 2013)(ACCT), Rohtak, 2013, pp. 208-210.
doi:10.1109/ACCT.2013.52
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