The Community for Technology Leaders
Green Image
Issue No. 01 - January/February (2012 vol. 10)
ISSN: 1540-7993
pp: 69-72
Zbigniew Kalbarczyk , University of Illinois
Jean Arlat , LAAS-CNRS
The evolution of silicon technologies toward nanoscale dimensions raises serious challenges regarding both dependability and security. This article briefly examines these challenges and offers some perspectives on how they might be met.
nanocomputing, fault tolerance, dependable computing, computer security
Zbigniew Kalbarczyk, Takashi Nanya, Jean Arlat, "Nanocomputing: Small Devices, Large Dependability Challenges", IEEE Security & Privacy, vol. 10, no. , pp. 69-72, January/February 2012, doi:10.1109/MSP.2012.17
82 ms
(Ver 3.3 (11022016))