Issue No. 01 - January/February (2012 vol. 10)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MSP.2012.17
Jean Arlat , LAAS-CNRS
Zbigniew Kalbarczyk , University of Illinois
Takashi Nanya , Canon
The evolution of silicon technologies toward nanoscale dimensions raises serious challenges regarding both dependability and security. This article briefly examines these challenges and offers some perspectives on how they might be met.
nanocomputing, fault tolerance, dependable computing, computer security
Z. Kalbarczyk, T. Nanya and J. Arlat, "Nanocomputing: Small Devices, Large Dependability Challenges," in IEEE Security & Privacy, vol. 10, no. , pp. 69-72, 2012.