Issue No. 06 - November/December (2009 vol. 7)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MSP.2009.187
Saar Drimer , University of Cambridge
Steven J. Murdoch , University of Cambridge
Ross Anderson , University of Cambridge
Bank customers are forced to rely on PIN entry devices in stores and bank branches to protect account details. The authors examined two market-leading devices and found them easy to compromise owing to both their design and the processes used to certify them as secure.
EMV, security, evaluation, certification, tamper resistance, Common Criteria, card fraud, bank fraud, PIN
S. Drimer, S. J. Murdoch and R. Anderson, "Failures of Tamper-Proofing in PIN Entry Devices," in IEEE Security & Privacy, vol. 7, no. , pp. 39-45, 2009.