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Issue No. 04 - July/August (2010 vol. 27)
ISSN: 0740-7459
pp: 58-64
Hongyu Zhang , Tsinghua University, Beijing
Sunghun Kim , Hong Kong University of Science and Technology, Hong Kong
ABSTRACT
Quality control charts, especially c-charts, can help monitor software quality evolution for defects over time. c-charts of the Eclipse and Gnome systems showed that for systems experiencing active maintenance and updates, quality evolution is complicated and dynamic. The authors identify six quality evolution patterns and describe their implications. Quality assurance teams can use c-charts and patterns to monitor quality evolution and prioritize their efforts.
INDEX TERMS
maintenance management, software quality, software quality assurance, quality evolution, statistical process control, software engineering
CITATION
Hongyu Zhang, Sunghun Kim, "Monitoring Software Quality Evolution for Defects", IEEE Software, vol. 27, no. , pp. 58-64, July/August 2010, doi:10.1109/MS.2010.66
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