Issue No. 06 - November/December (2000 vol. 17)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/52.895166
This article pro-poses subjective team estimation models calculated from individual estimates and investigates the accuracy of defect estimation models based on inspection data.
S. Biffl, "Using Inspection Data for Defect Estimation," in IEEE Software, vol. 17, no. , pp. 36-43, 2000.