Issue No. 06 - November/December (1998 vol. 15)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/52.730846
By employing the Orthogonal Defect Classification scheme, the authors are able to support management with a firm handle on technical decision making. Through the extensive capture and analysis of defect semantics, one can obtain information on project management, test effectiveness, reliability, quality, and customer usage. The article describes three real-life case studies, and demonstrates the applicability of their techniques.
K. A. Bassin, T. Kratschmer and P. Santhanam, "Evaluating Software Development Objectively," in IEEE Software, vol. 15, no. , pp. 66-74, 1998.