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Thanks to Our 1997 Referees

Pages: pp. 125-126


Ahrens, Judith, Computer Sciences Corp.Alvarez, Angel, Technical University of MadridAlverson, Gail, Tera Computer CompanyAndersen, Ole, Delta, Danish Electronics Light & AcousticsArtsy, Shaike, ARTSY Y-CASE: Intelligent InfoCraftersAuer, DagmarBanerjee, Bakul, Argonne National LaboratoryBastide, Remi, Universite Toulouse IBelanger, David, AT&T Bell LaboratoriesBhansali, Sanjay, Semantic DesignsBlanchette, Jr., Stephen, United Defense, LPBruckhaus, Tilmann, Sun MicrosystemsByrne, Eric, The University of Texas at ArlingtonByrnes, Christopher, The MITRE CorporationCarter, Bradley, Mississippi State UniversityCharles, Hughes, University of Central FloridaCook, Curtis, Oregon State UniversityCraig, Gary, Superlative Software Solutions, Inc.Curtis, Bill, TereQuestCusick, James, AT&TDeMirors, Onur, Dokuz Eylul UniversitesiDunham, Maggie, Southern Methodist UniversityDymond, Ken, Process Inc. USEmaldi, Mike, LABEINFavaro, John, Intecs Sistemi S.p.A.Fidge, Colin, The University of QueenslandFinnigan, Patrick, IBM SWS Toronto LabFuchs, Norbert, Alcatel Austria AGGaska, Marilyn, Lockheed Martin Federal SystemsGlickstein, StevenGomez-Molinero, Paco, Visual Tools S.A.Grochow, Jerrold, American Management Systems, Inc.Grudin, Jonathan, University of OsloHall, Anthony, Praxis SystemsHarrison, Rachel, University of SouthamptonHart, Richard, Digital Equipment Corp.Henninger, Scott, University of Nebraska - LincolnHirai, Katsuhiko, Matsushita Systems Engineering Co.Horch, John, The Horch CompanyHuang, Yennun, Lucent TechnologiesHuber, Andrew, Data General CorporationIsoda, Sadahiro, Toyohashi University of TechnologyJones, Trevor, Duquesne UniversityJuhlin, Bruce, OpenDisc Systems, Inc.Kansala, Kari, Nokia Research CenterKitchenham, Barbara, University of KeeleKitson, DavidKlinger, Allen, University of California, Los AngelesKnirk, Dwayne, Sandia National LaboratoriesKochikar, Vivekand, Infosys Technologies Ltd.Koltun, Philip, Harris CorporationKonrad, Mike, Carnegie Mellon UniversityKuntzmann-Combelles, Annie, Objectif TechnologieLayzell, Paul, UMISTLeung, Kwong Sak, The Chinese University of Hong KongLi, Frank, Technology Solutions CompanyLiddle, Alan, Trusted Information SystemsLinos, Panagiotis, Tennessee Technological UniversityLiu, Chengwen, DePaul UniversityLong, Darrell, University of California, Santa CruzLott, Christopher, BellcoreMachak, Tom, BTG, Inc.Maciaszek, Leszek, Macquarie UniversityMaguire, Gerald, KTH, Inst. for TeleinformatikMead, Nancy, Carnegie Mellon UniversityMeekel, Jacques, MotorolaMendal, Geoff, Tri-Pacific Corp.Mili, Fatma, Oakland UniversityMiyoshi, Takeshige, SRA CorporationModell, Howard, Boeing Defense and Space GroupMoitra, Deependra, Bell Labs Development CentreMongkolwat, Pattanasak, Compuport, LLCMonroe, Robert, Carnegie Mellon UniversityMularz, Diane, The MITRE CorporationMuller, Hausi, University of VictoriaMurphy, Melissa, Computing and Communications SystemsNakajima, Tsuyoshi, Mitsubishi Electric Corp.Norman, Ronald, San Diego State UniversityNotkin, David, University of WashingtonOberweis, Andreas, J.W. Goethe-UniversitaetPadget, Julian, University of BathPapadopoulos, George, University of CyprusParnas, David, McMaster UniversityPeachey, Judy, SybasePfleeger, Shari Lawrence, Howard UniversityPolak, WolfgangPrieto-Diaz, Ruben, Reuse, Inc.Prinetto, Paolo, Politecnico di TorinoPutnam, Lawrence, Quantitative Software Management, Inc.Ramachandran, Muthu, Philips Research LabsRobertson, Edward, Indiana UniversityRobertson, James, The Atlantic Systems Guild, Inc.Rosenberg, Linda, Unisys/GSFC NASARubin, HowardSage, Andrew, George Mason UniversitySallie, Henry, Virginia Polytechnic Inst. & State Univ.Sametinger, Johannes, Johannes Kepler University of LinzSanden, Bo, Colorado Technical UniversitySetliff, Dorothy, University of SydneySpinellis, Diomidis, SENA S.A.Stavely, Allan, New Mexico TechSung, Andrew, New Mexico TechSzulewski, Paul, Draper LaboratoryTervonen, Ilkka, University of OuluTracz, William, Lockheed Martin Federal SystemsVetter, Ronald, University of North Carolina at WilmingtonVollman, ThomasWebb, Todd, AutodeskWillis, Paul, Jet Propulsion LaboratoryWorkman, David, University of Central FloridaYoussef, Michel, Mitsubishi Electric Corp.Zelkowitz, Marvin, University of Maryland
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