Issue No. 05 - September (1996 vol. 13)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/52.536462
<p>The combinatorial design method substantially reduces testing costs. The authors describe an application in which the method reduced test plan development from one month to less than a week. In several experiments, the method demonstrated good code coverage and fault detection ability.</p>
S. R. Dalal, J. Parelius, G. C. Patton and D. M. Cohen, "The Combinatorial Design Approach to Automatic Test Generation," in IEEE Software, vol. 13, no. , pp. 83-88, 1996.