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ABSTRACT
<p>The combinatorial design method substantially reduces testing costs. The authors describe an application in which the method reduced test plan development from one month to less than a week. In several experiments, the method demonstrated good code coverage and fault detection ability.</p>
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CITATION

S. R. Dalal, J. Parelius, G. C. Patton and D. M. Cohen, "The Combinatorial Design Approach to Automatic Test Generation," in IEEE Software, vol. 13, no. , pp. 83-88, 1996.
doi:10.1109/52.536462
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