The Community for Technology Leaders
Green Image
<p>The combinatorial design method substantially reduces testing costs. The authors describe an application in which the method reduced test plan development from one month to less than a week. In several experiments, the method demonstrated good code coverage and fault detection ability.</p>
Siddhartha R. Dalal, Jesse Parelius, Gardner C. Patton, David M. Cohen, "The Combinatorial Design Approach to Automatic Test Generation", IEEE Software, vol. 13, no. , pp. 83-88, September 1996, doi:10.1109/52.536462
116 ms
(Ver 3.1 (10032016))