Issue No. 04 - July/August (1990 vol. 7)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/52.56422
<p>The use of context-free grammars to improve functional testing of very-large-scale integrated circuits is described. It is shown that enhanced context-free grammars are effective tools for generating test data. The discussion covers preliminary considerations, the first tests, generating systematic tests, and testing subroutines. The author's experience using context-free grammars to generate tests for VLSI circuit simulators indicates that they are remarkably effective tools that virtually anyone can use to debug virtually any program.</p>
test data generation; context-free grammars; functional testing; very-large-scale integrated circuits; systematic tests; testing subroutines; VLSI circuit simulators; debug; context-free grammars; integrated circuit testing; VLSI
P. M. Maurer, "Generating Test Data with Enhanced Context-Free Grammars," in IEEE Software, vol. 7, no. , pp. 50-55, 1990.