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Issue No. 05 - September/October (2017 vol. 37)
ISSN: 0272-1732
pp: 32-42
Xu Bai , NEC
Yuya Nagamatsu , University of Tokyo
Soichi Ookubo , University of Tokyo
Takuma Shirai , University of Tokyo
Fumihito Sugai , University of Tokyo
Masayuki Inaba , University of Tokyo
The authors demonstrate a field-programmable gate array (FPGA) based on NanoBridge, a novel resistive-change switch. NanoBridge, which is integrated in the back end of line (BEOL), features a high on/off conductance ratio, weak temperature dependence of its resistance, nonvolatility, endurance against soft errors, and a small footprint. In place of static RAM (SRAM) and a pass transistor, NanoBridge is utilized as a configuration switch in the FPGA. In this article, the authors evaluate the NanoBridge-based FPGA (NB-FPGA) for applications in harsh environments. Specifically, they implemented NB-FPGA in a humanoid robot and compared its performance with that of the conventional FPGA. Results showed that NB-FPGA exhibits small variation in performance over a wide range of temperature, from −55 to 150 °C, and has high immunity for fluctuations in the power supply voltage.
Field programmable gate arrays, Random access memory, Routing, Logic gates, Transistors, Reconfigurable logic, Radiation hardening (electronics),nonvolatile, reconfigurable, BEOL devices, back end of line, noise, high temperature, rad-hard, radiation hardening
Makoto Miyamura, Toshitsugu Sakamoto, Xu Bai, Yukihide Tsuji, Ayuka Morioka, Ryusuke Nebashi, Munehiro Tada, Naoki Banno, Koichiro Okamoto, Noriyuki Iguchi, Hiromitsu Hada, Tadahiko Sugibayashi, Yuya Nagamatsu, Soichi Ookubo, Takuma Shirai, Fumihito Sugai, Masayuki Inaba, "NanoBridge-Based FPGA in High-Temperature Environments", IEEE Micro, vol. 37, no. , pp. 32-42, September/October 2017, doi:10.1109/MM.2017.3711648
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