Issue No. 04 - July-Aug. (2013 vol. 33)
ISSN: 0272-1732
pp: 2
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MM.2013.86
Erik R. Altman , Thomas J. Watson Research Center
ABSTRACT
This column discusses the special issue on reliability, <it>IEEE Micro</it>'s requirement that authors add new material to any previously published work, and issues of plagiarism.
INDEX TERMS
hard errors, reliability, theme issues, IEEE, plagiarism, voltage, temperature, power, soft errors
CITATION
E. R. Altman, "Reliability, Theme Issues, and Plagiarism," in IEEE Micro, vol. 33, no. , pp. 2, 2013.
doi:10.1109/MM.2013.86
