Issue No. 04 - July-Aug. (2013 vol. 33)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MM.2013.86
Erik R. Altman , Thomas J. Watson Research Center
This column discusses the special issue on reliability, <it>IEEE Micro</it>'s requirement that authors add new material to any previously published work, and issues of plagiarism.
hard errors, reliability, theme issues, IEEE, plagiarism, voltage, temperature, power, soft errors
E. R. Altman, "Reliability, Theme Issues, and Plagiarism," in IEEE Micro, vol. 33, no. , pp. 2, 2013.