The Community for Technology Leaders
Green Image
Issue No. 04 - July-Aug. (2013 vol. 33)
ISSN: 0272-1732
pp: 2
Erik R. Altman , Thomas J. Watson Research Center
This column discusses the special issue on reliability, <it>IEEE Micro</it>'s requirement that authors add new material to any previously published work, and issues of plagiarism.
hard errors, reliability, theme issues, IEEE, plagiarism, voltage, temperature, power, soft errors
Erik R. Altman, "Reliability, Theme Issues, and Plagiarism", IEEE Micro, vol. 33, no. , pp. 2, July-Aug. 2013, doi:10.1109/MM.2013.86
108 ms
(Ver 3.1 (10032016))