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Issue No. 04 - July-Aug. (vol. 33)
ISSN: 0272-1732
From the Editor in Chief

Reliability, Theme Issues, and Plagiarism (HTML)

Erik R. Altman , Thomas J. Watson Research Center
pp. 2
Guest Editor's Introduction
Reliability-Aware Microarchitecture

Coping with Parametric Variation at Near-Threshold Voltages (Abstract)

Ulya R. Karpuzcu , University of Minnesota
Nam Sung Kim , University of Wisconsin-Madison
Josep Torrellas , University of Illinois at Urbana-Champaign
pp. 6-14

Improving Throughput of Power-Constrained Many-Core Processors Based on Unreliable Devices (Abstract)

Hao Wang , University of Wisconsin-Madison
Nam Sung Kim , University of Wisconsin-Madison
pp. 16-24

Resilient High-Performance Processors with Spare RIBs (Abstract)

David J. Palframan , University of Wisconsin-Madison
Nam Sung Kim , University of Wisconsin-Madison
Mikko H. Lipasti , University of Wisconsin-Madison
pp. 26-34

A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience (Abstract)

Veit B. Kleeberger , TU München
Christina Gimmler-Dumont , TU Kaiserslautern
Christian Weis , TU Kaiserslautern
Andreas Herkersdorf , TU München
Sani R. Nassif , IBM Research Austin
Ulf Schlichtmann , TU München
Norbert Wehn , TU Kaiserslautern
pp. 46-55

Evaluating Overheads of Multibit Soft-Error Protection in the Processor Core (Abstract)

Lukasz G. Szafaryn , University of Virginia
Brett H. Meyer , McGill University
Kevin Skadron , University of Virginia
pp. 56-65

Automating Stressmark Generation for Testing Processor Voltage Fluctuations (Abstract)

Youngtaek Kim , University of Texas at Austin
Lizy Kurian John , University of Texas at Austin
Sanjay Pant , Advanced Micro Devices
Srilatha Manne , Advanced Micro Devices
Michael Schulte , Advanced Micro Devices
W. Lloyd Bircher , Advanced Micro Devices
Madhu Saravana Sibi Govindan , Advanced Micro Devices
pp. 66-75
Micro Law
Micro Economics

Platform Conflicts [Micro Economics] (HTML)

Shane Greenstein , Northwestern University
pp. 78-79
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