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Issue No. 02 - March-April (2013 vol. 33)
ISSN: 0272-1732
pp: 18-26
CMOS integrated-circuit supply-voltage reduction has plateaued in recent years as increased transistor variability has limited transistor-threshold voltage scaling. The deeply depleted channel transistor, implemented on bulk CMOS, provides a low-cost option to re-enable voltage scaling on both future and legacy CMOS fabrication processes by reducing random variability and providing a strong body factor to pull in systematic variation and compensate for environmental effects resulting in 50 percent lower power at matched performance.
Transistors, CMOS integrated circuits, Voltage control, Random access memory, Threshold voltage, DDC, low power, voltage scaling, VLSI, CMOS, body bias, deeply depleted channel transistor, undoped channel transistor

L. T. Clark and R. Rogenmoser, "Reducing Transistor Variability for High Performance Low Power Chips," in IEEE Micro, vol. 33, no. , pp. 18-26, 2013.
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