The Community for Technology Leaders
Green Image
Issue No. 01 - January/February (2010 vol. 30)
ISSN: 0272-1732
pp: 110
Michael D. Smith , Harvard University
Meeta Gupta , Harvard University
Glenn Holloway , Harvard University
Vijay Janapa Reddi , Harvard University
David Brooks , Harvard University
Gu-Yeon Wei , Harvard University
<p>Shrinking feature size and diminishing supply voltage are making circuits more sensitive to supply voltage fluctuations within a microprocessor. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues. A mechanism that dynamically learns to predict dangerous voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger.</p>
performance, reliability, fault-tolerance, voltage noise, dI/dt, inductive noise, voltage emergencies
Michael D. Smith, Meeta Gupta, Glenn Holloway, Vijay Janapa Reddi, David Brooks, Gu-Yeon Wei, "Predicting Voltage Droops Using Recurring Program and Microarchitectural Event Activity", IEEE Micro, vol. 30, no. , pp. 110, January/February 2010, doi:10.1109/MM.2010.25
98 ms
(Ver 3.3 (11022016))