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Issue No. 01 - January/February (2010 vol. 30)
ISSN: 0272-1732
pp: 110
Vijay Janapa Reddi , Harvard University
Meeta Gupta , Harvard University
Glenn Holloway , Harvard University
Michael D. Smith , Harvard University
Gu-Yeon Wei , Harvard University
David Brooks , Harvard University
ABSTRACT
<p>Shrinking feature size and diminishing supply voltage are making circuits more sensitive to supply voltage fluctuations within a microprocessor. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues. A mechanism that dynamically learns to predict dangerous voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger.</p>
INDEX TERMS
performance, reliability, fault-tolerance, voltage noise, dI/dt, inductive noise, voltage emergencies
CITATION

M. D. Smith, M. Gupta, G. Holloway, V. J. Reddi, D. Brooks and G. Wei, "Predicting Voltage Droops Using Recurring Program and Microarchitectural Event Activity," in IEEE Micro, vol. 30, no. , pp. 110, 2010.
doi:10.1109/MM.2010.25
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