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Issue No. 05 - September/October (2009 vol. 29)
ISSN: 0272-1732
pp: 18-29
Jason A. Poovey , Georgia Institute of Technology
Markus Levy , EDN Embedded Microprocessor Benchmark Consortium
Shay Gal-On , EDN Embedded Microprocessor Benchmark Consortium
Thomas M. Conte , Georgia Institute of Technology
<p>Benchmark consumers expect benchmark suites to be complete, accurate, and consistent, and benchmark scores serve as relative measures of performance. However, it is important to understand how benchmarks stress the processors that they aim to test. This study explores the stress points of the EEMBC embedded benchmark suite using the benchmark characterization technique.</p>
benchmarking, benchmark characterization, embedded systems, workload characterization, EEMBC
Jason A. Poovey, Markus Levy, Shay Gal-On, Thomas M. Conte, "A Benchmark Characterization of the EEMBC Benchmark Suite", IEEE Micro, vol. 29, no. , pp. 18-29, September/October 2009, doi:10.1109/MM.2009.74
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