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Issue No. 06 - November/December (2007 vol. 27)
ISSN: 0272-1732
pp: 36-45
Scott Mahlke , University of Michigan
Resit Sendag , University of Rhode Island
Derek Chiou , University of Texas at Austin
Joshua J. Yi , Freescale Semiconductor
As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability. Following an introduction by Antonio González, Scott Mahlke and Shubu Mukherjee debate whether reliability is a legitimate concern for the microarchitect. Topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it.
control structure reliability, testing, and fault-tolerance; control structures and microprogramming; hardware; reliability, testing, and fault-tolerance; arithmetic and logic structures; memory structures; performance and reliability

S. Mahlke, D. Chiou, A. González, J. J. Yi, S. Mukherjee and R. Sendag, "Reliability: Fallacy or Reality?," in IEEE Micro, vol. 27, no. , pp. 36-45, 2008.
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