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Issue No. 06 - November/December (2007 vol. 27)
ISSN: 0272-1732
pp: 36-45
Scott Mahlke , University of Michigan
Derek Chiou , University of Texas at Austin
Joshua J. Yi , Freescale Semiconductor
Resit Sendag , University of Rhode Island
ABSTRACT
As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability. Following an introduction by Antonio González, Scott Mahlke and Shubu Mukherjee debate whether reliability is a legitimate concern for the microarchitect. Topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it.
INDEX TERMS
control structure reliability, testing, and fault-tolerance; control structures and microprogramming; hardware; reliability, testing, and fault-tolerance; arithmetic and logic structures; memory structures; performance and reliability
CITATION
Scott Mahlke, Derek Chiou, Antonio González, Joshua J. Yi, Shubu Mukherjee, Resit Sendag, "Reliability: Fallacy or Reality?", IEEE Micro, vol. 27, no. , pp. 36-45, November/December 2007, doi:10.1109/MM.2007.107
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