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Issue No.05 - September/October (2006 vol.26)
pp: 19-27
Kundan Nepal , Brown University
R. Iris Bahar , Brown University
Joseph Mundy , Brown University
William R. Patterson , Brown University
Alexander Zaslavsky , Brown University
Shrinking devices to nanoscale, increasing integration densities, and reducing voltage levels to the thermal limit?all conspire to produce faulty systems. A possible solution is a fault-tolerant probabilistic framework based on Markov random fields. This article introduces a new redundancy element, the MRF reinforcer, which achieves significant immunity to single-event upsets and noise.
Reliability, Markov random fields, probabilistic computing, noise immunity, redundancy
Kundan Nepal, R. Iris Bahar, Joseph Mundy, William R. Patterson, Alexander Zaslavsky, "MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits", IEEE Micro, vol.26, no. 5, pp. 19-27, September/October 2006, doi:10.1109/MM.2006.96
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