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Issue No. 05 - September/October (2006 vol. 26)
ISSN: 0272-1732
pp: 19-27
Kundan Nepal , Brown University
R. Iris Bahar , Brown University
Joseph Mundy , Brown University
William R. Patterson , Brown University
Alexander Zaslavsky , Brown University
Shrinking devices to nanoscale, increasing integration densities, and reducing voltage levels to the thermal limit?all conspire to produce faulty systems. A possible solution is a fault-tolerant probabilistic framework based on Markov random fields. This article introduces a new redundancy element, the MRF reinforcer, which achieves significant immunity to single-event upsets and noise.
Reliability, Markov random fields, probabilistic computing, noise immunity, redundancy

W. R. Patterson, K. Nepal, R. I. Bahar, A. Zaslavsky and J. Mundy, "MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits," in IEEE Micro, vol. 26, no. , pp. 19-27, 2006.
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