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Issue No. 05 - September/October (2006 vol. 26)
ISSN: 0272-1732
pp: 19-27
Kundan Nepal , Brown University
R. Iris Bahar , Brown University
Joseph Mundy , Brown University
William R. Patterson , Brown University
Alexander Zaslavsky , Brown University
ABSTRACT
Shrinking devices to nanoscale, increasing integration densities, and reducing voltage levels to the thermal limit?all conspire to produce faulty systems. A possible solution is a fault-tolerant probabilistic framework based on Markov random fields. This article introduces a new redundancy element, the MRF reinforcer, which achieves significant immunity to single-event upsets and noise.
INDEX TERMS
Reliability, Markov random fields, probabilistic computing, noise immunity, redundancy
CITATION

W. R. Patterson, K. Nepal, R. I. Bahar, A. Zaslavsky and J. Mundy, "MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits," in IEEE Micro, vol. 26, no. , pp. 19-27, 2006.
doi:10.1109/MM.2006.96
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