The Community for Technology Leaders
Green Image
Issue No. 06 - November/December (2005 vol. 25)
ISSN: 0272-1732
pp: 8-9
Sarita V. Adve , University of Illinois at Urbana-Champaign
Pia Sanda , IBM
ABSTRACT
This special issue of <em>IEEE Micro</em> addresses the trends toward reliability-aware microarchitecture, their system-level implications, and some innovative ideas on how to build systems in the face of those challenges.
INDEX TERMS
Reliability-aware microarchitecture, CMOS scaling, soft errors, reliability management
CITATION

S. V. Adve and P. Sanda, "Guest Editors' Introduction: Reliability-Aware Microarchitecture," in IEEE Micro, vol. 25, no. , pp. 8-9, 2005.
doi:10.1109/MM.2005.112
95 ms
(Ver 3.3 (11022016))