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Issue No. 05 - September/October (2005 vol. 25)
ISSN: 0272-1732
pp: 64-76
Diana Marculescu , Carnegie Mellon University
Emil Talpes , Carnegie Mellon University
The authors present microarchitecture-level statistical models for characterizing process and system parameter variability, concentrating on gate length and on-chip temperature variations. To assess the effect of microarchitecture decisions on these variations, and vice versa, they propose a joint performance, power, and variability metric that distinguishes among various design choices.
Energy awareness, gate length, on-chip temperature variations, variability metric

E. Talpes and D. Marculescu, "Energy Awareness and Uncertainty in Microarchitecture-Level Design," in IEEE Micro, vol. 25, no. , pp. 64-76, 2005.
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