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Issue No. 03 - May/June (2005 vol. 25)
ISSN: 0272-1732
pp: 70-80
Jayanth Srinivasan , University of Illinois, Urbana-Champaign
ABSTRACT
As scaling threatens to erode reliability standards, lifetime reliability must become a first-class design constraint. Microarchitectural intervention offers a novel way to manage lifetime reliability without significantly sacrificing cost and performance.
INDEX TERMS
Lifetime reliability, scaling, power management, RAMP, MTTF, DRM
CITATION
Sarita V. Adve, Pradip Bose, Jude A. Rivers, Jayanth Srinivasan, "Lifetime Reliability: Toward an Architectural Solution", IEEE Micro, vol. 25, no. , pp. 70-80, May/June 2005, doi:10.1109/MM.2005.54
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