Issue No. 04 - July/August (2003 vol. 23)
Cristian Constantinescu , Intel
<p>Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them. </p>
C. Constantinescu, "Trends and Challenges in VLSI Circuit Reliability," in IEEE Micro, vol. 23, no. , pp. 14-19, 2003.