The Community for Technology Leaders
Green Image
Issue No. 04 - July/August (2003 vol. 23)
ISSN: 0272-1732
pp: 14-19
ABSTRACT
<p>Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them. </p>
INDEX TERMS
CITATION
Cristian Constantinescu, "Trends and Challenges in VLSI Circuit Reliability", IEEE Micro, vol. 23, no. , pp. 14-19, July/August 2003, doi:10.1109/MM.2003.1225959
91 ms
(Ver 3.1 (10032016))