Issue No. 05 - September/October (2001 vol. 21)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/40.958701
Embedded computers commonly rely on multiple-board systems, called tristate system environments. These environments consist of an interconnect and drivers or receivers with tristate features and boundary scan capabilities. The authors present a comprehensive fault model that provides 100 percent fault coverage and minimizes test set size.
W. Feng, F. Lombardi and F. Karimi, "Fault Detection in a Tristate System Environment," in IEEE Micro, vol. 21, no. , pp. 77-85, 2001.