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Issue No. 05 - September/October (2001 vol. 21)
ISSN: 0272-1732
pp: 77-85
Embedded computers commonly rely on multiple-board systems, called tristate system environments. These environments consist of an interconnect and drivers or receivers with tristate features and boundary scan capabilities. The authors present a comprehensive fault model that provides 100 percent fault coverage and minimizes test set size.
Wenyi Feng, Fabrizio Lombardi, Farzin Karimi, "Fault Detection in a Tristate System Environment", IEEE Micro, vol. 21, no. , pp. 77-85, September/October 2001, doi:10.1109/40.958701
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