Issue No. 06 - November/December (2000 vol. 20)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/40.888706
The increasing complexity of realistic benchmarks combined with the relatively sluggish rate of detailed performance analysis has resulted in an ever-increasing gap between the size of the workload and the speed of analysis. We have presented a methodology for generating and validating representative input sampled data (traces) from SPEC95 benchmark suite using R-metric and K-metric. Experimental results demonstrate the superiority of our proposed technique over the existing popular profile-driven methodology and the uniform sampling approach.
H. Khalid, "Validating Trace-Driven Microarchitectural Simulations," in IEEE Micro, vol. 20, no. , pp. 76-82, 2000.