Issue No. 01 - February (1994 vol. 14)
pp: 8-11, 13-23
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/40.259894
<p>Fault injection is an effective method for studying the effects of faults in computer systems and for validating fault-handling mechanisms. The approach presented involves injecting transient faults into integrated circuits by using heavy-ion radiation from a Californium-252 source. The proliferation of safety-critical and fault-tolerant systems using VLSI technology makes such attempts to inject faults at internal locations in VLSI circuits increasingly important.</p>
R. Johansson, P. Dahlgren, U. Gunneflo, J. Karlsson and P. Liden, "Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms," in IEEE Micro, vol. 14, no. , pp. 8-11, 13-23, 1994.