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ABSTRACT
<p>Fault injection is an effective method for studying the effects of faults in computer systems and for validating fault-handling mechanisms. The approach presented involves injecting transient faults into integrated circuits by using heavy-ion radiation from a Californium-252 source. The proliferation of safety-critical and fault-tolerant systems using VLSI technology makes such attempts to inject faults at internal locations in VLSI circuits increasingly important.</p>
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CITATION
Rolf Johansson, Peter Dahlgren, Ulf Gunneflo, Johan Karlsson, Peter Liden, "Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms", IEEE Micro, vol. 14, no. , pp. 8-11, 13-23, February 1994, doi:10.1109/40.259894
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