Issue No. 02 - March/April (1993 vol. 13)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/40.207087
<p>The stresses and strains in substrate-connector systems in multichip modules (MCMs) are discussed. Simultaneous stresses were applied as structural loads in combined stress models. Modeling results show that definite relations exist between connector pitch, length, substrate thickness and material, and stresses in a connector body.</p>
Y. Belopolsky, "Interaction of Multichip Module Substrates with High-Density Connectors," in IEEE Micro, vol. 13, no. , pp. 36-44, 1993.