Issue No. 01 - January/February (1986 vol. 6)
James Aylor , University of Virginia
Barry Johnson , University of Virginia
Bruce Rector , Burroughs Corporation
J. Aylor, B. Rector and B. Johnson, "Structured Design for Testability in Semicustom VLSI," in IEEE Micro, vol. 6, no. , pp. 51-58, 1986.