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Issue No. 01 - January/February (1986 vol. 6)
ISSN: 0272-1732
pp: 51-58
James Aylor , University of Virginia
Bruce Rector , Burroughs Corporation
Barry Johnson , University of Virginia
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CITATION
James Aylor, Bruce Rector, Barry Johnson, "Structured Design for Testability in Semicustom VLSI", IEEE Micro, vol. 6, no. , pp. 51-58, January/February 1986, doi:10.1109/MM.1986.304637
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