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Issue No. 04 - July/August (1983 vol. 3)
ISSN: 0272-1732
pp: 104-a
INDEX TERMS
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CITATION
"Exchange Ideas at the 1983 International Test Contference.", IEEE Micro, vol. 3, no. , pp. 104-a, July/August 1983, doi:10.1109/MM.1983.291150
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