Issue No. 06 - December (1991 vol. 6)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/64.108950
<p>A diagnosis algorithm called Inc-Diagnose that can generate diagnosis candidates incrementally and detect multiple faults is presented. It models continuously changing device states using a discrete set of Qsim qualitative states over time. Inc-Diagnose is a modification of R. Reiter's algorithm (Artif. Intell., vol.32., no.1, p.57-95, 1987), the theory of which is reviewed. An example diagnosis is given.</p>
H. T. Ng, "Model-Based, Multiple-Fault Diagnosis of Dynamic, Continuous Physical Devices," in IEEE Intelligent Systems, vol. 6, no. , pp. 38-43, 1991.