Finding method in Madness (Abstract)

Model-based reasoning: The applications gap (Abstract)

Classifying Cells for Cancer Diagnosis Using Neural Networks (Abstract)

Using Functional Models in Automatic Debugging (Abstract)

Intelligent Monitoring and Control of Semiconductor Manufacturing Equipment (Abstract)

Knowledge Acquisition from Structured Data: Using Determinate Literals to Assist Search (Abstract)

Model-Based, Multiple-Fault Diagnosis of Dynamic, Continuous Physical Devices (Abstract)

The Japanese mechatronic revolution (Abstract)

News (Abstract)

Conferences (Abstract)

Nexpert Object (Abstract)

New Products (Abstract)

Book Reviews (Abstract)

New Books (Abstract)

Annual Index (Abstract)