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High-resolution ADCs generally require high-end testers to ensure their performances meeting design specifications. This paper presents new test methods that facilitate to test such devices with low-cost testers.
Mathematical model, Sigma-delta modulation, Computational modeling, Noise measurement, Testing, Signal to noise ratio,fast Fourier transform (FFT), Sigma-delta (ÄÓ), Analog-to-Digital converters (ADCs), dynamic specifications test, alternate test, device under test (DUT), design-for-test (DfT), built-in-self-test (BIST)
"Dynamic Specification Testing and Diagnosis of High-Precision Sigma-Delta ADCs", IEEE Design & Test of Computers, vol. 30, no. , pp. 36-48, August 2013, doi:10.1109/MDT.2012.2217111
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