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TABLE OF CONTENTS
Issue No. 02 - April (vol. 30)
ISSN: 0740-7475
Papers

[Front cover] (Abstract)

pp. C1

[Front cover] (PDF)

pp. C1
Papers

Table of contents (Abstract)

pp. 2

Table of contents (Abstract)

pp. 3

Guest Editors' Introduction: Trusted System-on-Chip with Untrusted Components (Abstract)

Swarup Bhunia , Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH, USA
Dakshi Agrawal , IBM TJ Watson Research Center , Yorktown Heights, USA
Leyla Nazhandali , Virginia Tech , Blacksburg,
pp. 5-7

A Clock Sweeping Technique for Detecting Hardware Trojans Impacting Circuits Delay (Abstract)

Kan Xiao , ECE Dept., Univ. of Connecticut, Storrs, CT, USA
Xuehui Zhang , ECE Dept., Univ. of Connecticut, Storrs, CT, USA
Mohammad Tehranipoor , ECE Dept., Univ. of Connecticut, Storrs, CT, USA
pp. 26-34

Securing Processors Against Insider Attacks: A Circuit-Microarchitecture Co-Design Approach (Abstract)

J. Rajendran , Polytech. Inst., New York Univ., New York, OH, USA
A. K. Kanuparthi , Polytech. Inst., New York Univ., New York, NY, USA
M. Zahran , New York Univ., New York, NY, USA
S. K. Addepalli , Cisco, USA
G. Ormazabal , Columbia Univ., New York, NY, USA
R. Karri , Polytech. Inst., New York Univ., New York, OH, USA
pp. 35-44

Diverse Double Modular Redundancy: A New Direction for Soft-Error Detection and Correction (Abstract)

P. Reviriego , Univ. Antonio de Nebrija, Madrid, Spain
C. J. Bleakley , Univ. Antonio de Nebrija, Madrid, Spain
J. A. Maestro , Univ. Coll. Dublin, Dublin, Ireland
pp. 87-95

IEEE Phaser Data (Abstract)

pp. 96

CEDA Currents (Abstract)

pp. 97-98

Test Technology TC Newsletter (Abstract)

Theo Theocharides , Department of Electrical and Computer Engineering, University of Cyprus, Nicosia, Cyprus
pp. 100-101

IEEE Was Here (Abstract)

pp. 102

Let's stop trusting software with our sensitive data (Abstract)

C. Fletcher , MIT CSAIL, Cambridge, MA, USA
M. van Dijk , MIT CSAIL, Cambridge, MA, USA
S. Devadas , MIT CSAIL, Cambridge, MA, USA
pp. 103-104

CEDA Currents (PDF)

pp. 97-98

Test Technology TC Newsletter (PDF)

pp. 100-101

IEEE Was Here (PDF)

pp. 102
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