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Issue No. 01 - February (2013 vol. 30)
ISSN: 0740-7475
pp: 26-35
Fang Gong , Univ. of California, Los Angeles, Los Angeles, CA, USA
Wei Wu , Univ. of California, Los Angeles, Los Angeles, CA, USA
R. Krishnan , Univ. of California, Los Angeles, Los Angeles, CA, USA
Lei He , Nanyang Technol. Univ., Singapore, Singapore
Hao Yu , Nanyang Technol. Univ., Singapore, Singapore
ABSTRACT
The authors present a methodology geared towards EDA applications such as parasitic extraction, transient circuit simulation, and RF steady-state simulations.
INDEX TERMS
parallel processing, electronic design automation, electronic design automation, parallelism, data dependency elimination, circuit simulation algorithm, EDA application, parasitic extraction, transient circuit simulation, RF steady-state simulation, Sparse matrices, Algorithm design and analysis, Integrated circuit modeling, Program processors, Circuit simulation, Parallel processing, Data processing, Circuit Simulation, Parallelism and concurrency, Data dependencies, Parallel Algorithms
CITATION
Fang Gong, Wei Wu, R. Krishnan, Lei He, Hao Yu, "Exploiting Parallelism by Data Dependency Elimination: A Case Study of Circuit Simulation Algorithms", IEEE Design & Test of Computers, vol. 30, no. , pp. 26-35, February 2013, doi:10.1109/MDT.2012.2226201
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