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TABLE OF CONTENTS
Issue No. 06 - Dec. (vol. 29)
ISSN: 0740-7475

[Front cover] (PDF)

pp. C1

Table of contents (PDF)

pp. 2

Guest Editors' Introduction: Digitally Enhanced Wireless Transceivers (PDF)

Haralampos-G. Stratigopoulos , TIMA Laboratory (CNRS-Grenoble INP-UJF), Grenoble, France
Alberto Valdes-Garcia , IBM T.J. Watson Research Center , Yorktown Heights, NY, USA
pp. 5-6

Digitally intensive wireless transceivers (Abstract)

R. B. Staszewski , Dept. of Microelectron., Delft Univ. of Technol., Delft, Netherlands
pp. 7-18

Digitally intensive receiver design: opportunities and challenges (Abstract)

R. Nanda , Univ. of California, Los Angeles, Los Angeles, CA, USA
D. Markovic , Univ. of California, Los Angeles, Los Angeles, CA, USA
pp. 19-26

Dual-Control Self-Healing Architecture for High-Performance Radio SoCs (Abstract)

C. Chien , CreoNex Syst. Inc., Westlake Village, CA, USA
A. Tang , Univ. of California, Los Angeles, Los Angeles, CA, USA
F. Hsiao , Univ. of California, Los Angeles, Los Angeles, CA, USA
M. F. Chang , Univ. of California, Los Angeles, Los Angeles, CA, USA
pp. 40-51

Pioneering in Asia With the US Venture Capital Model (PDF)

Erik Jan Marinissen , imec, Leuven, Belgium, Leuven, Belgium
pp. 52-55

Bringing up a chip on the cheap (Abstract)

M. Wachs , Electr. Eng. Dept., Stanford Univ., Stanford, CA, USA
O. Shacham , Electr. Eng. Dept., Stanford Univ., Stanford, CA, USA
Z. Asgar , Electr. Eng. Dept., Stanford Univ., Stanford, CA, USA
A. Firoozshahian , Hicamp Syst. Inc., Menlo Park, CA, USA
S. Richardson , Electr. Eng. Dept., Stanford Univ., Stanford, CA, USA
M. Horowitz , Electr. Eng. Dept., Stanford Univ., Stanford, CA, USA
pp. 57-65

Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection (Abstract)

D. Gil-Tomas , Dept. de Inf. de Sist. y Comput., Univ. Politec. de Valencia (UPV), Valencia, Spain
J. Gracia-Moran , Dept. de Inf. de Sist. y Comput., Univ. Politec. de Valencia (UPV), Valencia, Spain
J-C Baraza-Calvo , Dept. de Inf. de Sist. y Comput., Univ. Politec. de Valencia (UPV), Valencia, Spain
L-J Saiz-Adalid , Dept. de Inf. de Sist. y Comput., Univ. Politec. de Valencia (UPV), Valencia, Spain
P-J Gil-Vicente , Dept. de Inf. de Sist. y Comput., Univ. Politec. de Valencia (UPV), Valencia, Spain
pp. 66-73

Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits (Abstract)

Ting Zhu , Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
M. B. Steer , Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
P. D. Franzon , Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
pp. 74-83

Predicting the future of information technology and society [The Road Ahead] (PDF)

A. B. Kahng , Dept. of Comput. Sci. & Eng., Univ. of California at San Diego, La Jolla, CA, USA
pp. 101-102

CEDA Currents (PDF)

pp. 108-109

Test Technology TC Newsletter (PDF)

Theo Theocharides , Department of Electrical and Computer Engineering, University of Cyprus, 75 Kallipoleos Avenue, Nicosia, Cyprus
pp. 111-112

[Back inside cover] (PDF)

pp. C3
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