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This paper focuses on the V4-2007 extension of the Standard Test Data Format (STDF). STDF has been used as the standard representation for logging test data from automatic test equipment (ATE). This format however lacked a key capability, i.e., storing scan test results. The V4-2007 extension of this standard, as described in this paper, provides details on its ability in efficiently storing scan test results. Thus this standard now provides a complete and unified repository to store the results of parametric tests, functional tests and scan tests, all in a consistent format to aid in fault diagnosis and yield learning. This has in turn simplified the test flow and tracking of all necessary data to ensure more time-efficient testing and failure diagnosis.
Automatic test pattern generation, Standards, Operating systems, Graphics processing unit,
M. Seuring, M. Braun, A. Ma, G. Eide, K. Yang, Huaxing Tang, "Employing the STDF V4-2007 Standard for Scan Test Data Logging", IEEE Design & Test of Computers, vol. 29, no. , pp. 91-99, Dec. 2012, doi:10.1109/MDT.2012.2210533
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