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TABLE OF CONTENTS
Issue No. 05 - Oct. (vol. 29)
ISSN: 0740-7475
Papers

IEEE Digital Library (Abstract)

pp. C3

Guest Editors' introduction: On-chip structures for smarter silicon (Abstract)

LeRoy Winemberg , Freescale Semiconductor, Berkeley,
Mohammad Tehranipoor , Electrical and Computer Engineering Dept., University of Connecticut, Storrs,
pp. 6-7

ITC - Where fantasy becomes reality (Abstract)

Scott Davidson , Oracle, Network Circle, Santa Clara,
pp. 112
Papers

Table of contents (Abstract)

pp. 2

Departments (Abstract)

pp. 3

Process and Reliability Sensors for Nanoscale CMOS (Abstract)

Sachin S. Sapatnekar , University of Minnesota, Minneapolis,
Qunzeng Liu , University of Minnesota, Minneapolis, MN, USA
Chris H. Kim , University of Minnesota, Minneapolis, MN, USA
John P. Keane , University of Minnesota , Minneapolis, MN, USA
pp. 8-17

[Front cover] (Abstract)

pp. C1
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