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Issue No. 05 - Oct. (2012 vol. 29)
ISSN: 0740-7475
pp: 100-101
ABSTRACT
IEEE Design & Test of Computers seeks original manuscripts for a special issue on the "Variability and Aging" topic, scheduled for publication in November/December 2013. This special issue will cover recent works on variability and aging, including modeling circuit techniques, and innovative monitoring and countermeasure mechanisms at the circuit, micro-architectural, and system level to mitigate variability and improve reliability.
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CITATION
"Call for papers: Special Issue on Variability and Aging", IEEE Design & Test of Computers, vol. 29, no. , pp. 100-101, Oct. 2012, doi:10.1109/MDT.2012.2223992
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