Issue No. 05 - Oct. (2012 vol. 29)
IEEE Design & Test of Computers seeks original manuscripts for a special issue on the "Variability and Aging" topic, scheduled for publication in November/December 2013. This special issue will cover recent works on variability and aging, including modeling circuit techniques, and innovative monitoring and countermeasure mechanisms at the circuit, micro-architectural, and system level to mitigate variability and improve reliability.
"Call for papers: Special Issue on Variability and Aging," in IEEE Design & Test of Computers, vol. 29, no. , pp. 100-101, 2012.