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Issue No. 05 - Oct. (2012 vol. 29)
ISSN: 0740-7475
pp: 8-17
Sachin S. Sapatnekar , University of Minnesota, Minneapolis,
Qunzeng Liu , University of Minnesota, Minneapolis, MN, USA
Chris H. Kim , University of Minnesota, Minneapolis, MN, USA
John P. Keane , University of Minnesota , Minneapolis, MN, USA
ABSTRACT
Editor's notes:
INDEX TERMS
Stress analysis, Aging, Frequency measurement, Temperature measurement, Sensor phenomena and characterization, Odometers, Path planning, Silicon odometer, Reliability, Variations, Bias Temperature Instability, Sensors, Critical Paths
CITATION
Sachin S. Sapatnekar, Qunzeng Liu, Chris H. Kim, John P. Keane, "Process and Reliability Sensors for Nanoscale CMOS", IEEE Design & Test of Computers, vol. 29, no. , pp. 8-17, Oct. 2012, doi:10.1109/MDT.2012.2211561
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