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Issue No. 05 - Oct. (2012 vol. 29)
ISSN: 0740-7475
pp: 72-80
Maikel van Beurden , NXP Semiconductors, The Netherlands
Hamidreza Hashempour , NXP Semiconductors, The Netherlands
Camelia Hora , NXP Semiconductors, The Netherlands
Jos Dohmen , NXP Semiconductors, The Netherlands
Bratislav Tasic , NXP Semiconductors, The Netherlands
Bram Kruseman , High-Tech Campus 46, NXP Semiconductors, The Netherlands
Yizi Xing , NXP Semiconductors, The Netherlands
ABSTRACT
Editor's notes:
INDEX TERMS
Circuit faults, Integrated circuit modeling, US Department of Transportation, Bridge circuits, Analytical models, Computational modeling
CITATION

M. van Beurden et al., "Defect Oriented Testing for Analog/Mixed-Signal Designs," in IEEE Design & Test of Computers, vol. 29, no. , pp. 72-80, 2012.
doi:10.1109/MDT.2012.2210852
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