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Issue No. 05 - Oct. (2012 vol. 29)
ISSN: 0740-7475
pp: 63-71
Daisuke Watanabe , ADVANTEST Corporation,
Masayuki Kawabata , ADVANTEST Corporation,
Tasuku Fujibe , ADVANTEST Corporation,
Kiyotaka Ichiyama , ADVANTEST Corporation,
Masahiro Ishida , ADVANTEST Corporation,
ABSTRACT
Editor's notes:
INDEX TERMS
Testing, Jitter, Real time systems, Timing, Threshold voltage, Receivers, Noise measurement, jitter tolerance, multi-level signal interface, multi-level signal testing, voltage noise tolerance
CITATION
Daisuke Watanabe, Masayuki Kawabata, Tasuku Fujibe, Kiyotaka Ichiyama, Masahiro Ishida, "Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost", IEEE Design & Test of Computers, vol. 29, no. , pp. 63-71, Oct. 2012, doi:10.1109/MDT.2012.2210382
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