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Issue No. 01 - January (2012 vol. 29)
ISSN: 0740-7475
pp: 48-58
Shyam Kumar Devarakond , Georgia Institute of Technology , Atlanta,
Shreyas Sen , Intel Circuit Research Lab , Hillsboro,
Abhijit Chatterjee , Georgia Institute of Technology, Atlanta,
Soumendu Bhattacharya , Texas Instruments, Dallas,
ABSTRACT
Editor's note:
INDEX TERMS
Semiconductor device modeling, Radio frequency, Concurrent computing, Integrated circuit modeling, Computational modeling, Process control
CITATION
Shyam Kumar Devarakond, Shreyas Sen, Abhijit Chatterjee, Soumendu Bhattacharya, "Concurrent Device/Specification Cause -- Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures", IEEE Design & Test of Computers, vol. 29, no. , pp. 48-58, January 2012, doi:10.1109/MDT.2011.2179348
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