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Issue No. 01 - January (2012 vol. 29)
ISSN: 0740-7475
pp: 48-58
Shyam Kumar Devarakond , Georgia Institute of Technology , Atlanta,
Shreyas Sen , Intel Circuit Research Lab , Hillsboro,
Soumendu Bhattacharya , Texas Instruments, Dallas,
Abhijit Chatterjee , Georgia Institute of Technology, Atlanta,
ABSTRACT
Editor's note:
INDEX TERMS
Semiconductor device modeling, Radio frequency, Concurrent computing, Integrated circuit modeling, Computational modeling, Process control
CITATION

S. K. Devarakond, S. Sen, A. Chatterjee and S. Bhattacharya, "Concurrent Device/Specification Cause -- Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures," in IEEE Design & Test of Computers, vol. 29, no. , pp. 48-58, 2012.
doi:10.1109/MDT.2011.2179348
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