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Issue No. 01 - January (2012 vol. 29)
ISSN: 0740-7475
pp: 28-35
Nathan Kupp , Yale University,
Yiorgos Makris , Electrical Engineering Department, The University of Texas at Dallas, Richardson, TX, USA
ABSTRACT
Editor's note:
INDEX TERMS
Adaptation models, Adaptive systems, Semiconductor device modeling, Data models, Testing, Analytical models
CITATION

Y. Makris and N. Kupp, "Applying the Model-View-Controller Paradigm to Adaptive Test," in IEEE Design & Test of Computers, vol. 29, no. , pp. 28-35, 2012.
doi:10.1109/MDT.2011.2179370
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