Issue No. 01 - January (2012 vol. 29)
Nathan Kupp , Yale University,
Yiorgos Makris , Electrical Engineering Department, The University of Texas at Dallas, Richardson, TX, USA
Adaptation models, Adaptive systems, Semiconductor device modeling, Data models, Testing, Analytical models
Y. Makris and N. Kupp, "Applying the Model-View-Controller Paradigm to Adaptive Test," in IEEE Design & Test of Computers, vol. 29, no. , pp. 28-35, 2012.