Issue No. 01 - January (2012 vol. 29)
Sounil Biswas , Nvidia, Santa Clara,
Bruce Cory , Nvidia, Santa Clara,
Integrated circuits, Semiconductor device measurement, Wafer scale integration, Correlation, Graphics, Frequency measurement, Ring oscillators, System-level design
S. Biswas and B. Cory, "An Industrial Study of System-Level Test," in IEEE Design & Test of Computers, vol. 29, no. , pp. 19-27, 2012.