Issue No. 01 - January (2012 vol. 29)
Anne Gattiker , IBM,
Phil Nigh , Microelectronics Division, IBM Server & Technology Group,
The articles in this special section are devoted to the topic yield learning processes and methods.
Special issues and sections, Yield estimation, Learning systems, Machine learning, Failure analysis, Fault diagnosis
P. Nigh and A. Gattiker, "Guest Editors' Introduction: Yield Learning Processes and Methods," in IEEE Design & Test of Computers, vol. 29, no. , pp. 6-7, 2012.