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Issue No. 01 - January (2012 vol. 29)
ISSN: 0740-7475
pp: 6-7
Phil Nigh , Microelectronics Division, IBM Server & Technology Group,
ABSTRACT
The articles in this special section are devoted to the topic yield learning processes and methods.
INDEX TERMS
Special issues and sections, Yield estimation, Learning systems, Machine learning, Failure analysis, Fault diagnosis
CITATION
Phil Nigh, Anne Gattiker, "Guest Editors' Introduction: Yield Learning Processes and Methods", IEEE Design & Test of Computers, vol. 29, no. , pp. 6-7, January 2012, doi:10.1109/MDT.2011.2180958
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