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Issue No. 06 - Nov.-Dec. (2011 vol. 28)
ISSN: 0740-7475
pp: 94-95
ABSTRACT
<p>This column describes the IEEE 2011 East-West Design &#x0026; Test International Symposium and the 3D-Test Workshop at the 2011 International Test Conference.</p>
INDEX TERMS
design and test, 3D-Test, EWDTS
CITATION
"Conference Reports", IEEE Design & Test of Computers, vol. 28, no. , pp. 94-95, Nov.-Dec. 2011, doi:10.1109/MDT.2011.124
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