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Issue No. 06 - Nov.-Dec. (2011 vol. 28)
ISSN: 0740-7475
pp: 76-84
Christophe Kelma , NXP Semiconductors
Louay Abdallah , TIMA Laboratory
Salvador Mir , TIMA Laboratory
<p>This article proposes a new class of sensors for built-in test in RF devices. These sensors are placed in close proximity to the DUT on the same substrate without being electrically connected to it. Instead, they monitor it by virtue of being subjected to the same process variations. The authors also describe other types of sensors they have studied, including DC probes, an envelope detector, and a current sensor.</p>
design and test, RF test, built-in test, on-chip sensors, alternate test, DUT
Christophe Kelma, Louay Abdallah, Salvador Mir, Haralampos-G. Stratigopoulos, "RF Front-End Test Using Built-in Sensors", IEEE Design & Test of Computers, vol. 28, no. , pp. 76-84, Nov.-Dec. 2011, doi:10.1109/MDT.2011.131
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