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Issue No.06 - Nov.-Dec. (2011 vol.28)
pp: 66-75
Dallas L. Webster , Texas Instruments
Rick Hudgens , Texas Instruments
Donald Lie , Texas Tech University
<p>RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100% of EVM failures during production of over a million devices, which presents significant opportunities for both cost and time savings.</p>
design and test, BIST, CMOS integrated circuits, EVM, production test, RF-BIST, RF-SoC, self-calibration, self-testing, SoC, wireless LAN
Dallas L. Webster, Rick Hudgens, Donald Lie, "Replacing Error Vector Magnitude Test with RF and Analog BISTs", IEEE Design & Test of Computers, vol.28, no. 6, pp. 66-75, Nov.-Dec. 2011, doi:10.1109/MDT.2011.1
1. R.B. Staszewski et al., "A 24mm2 Quad-Band Single-Chip GSM Radio with Transmitter Calibration in 90nm Digital CMOS," Proc. IEEE Int'l Solid-State Circuits Conf. (ISSCC 08), IEEE CS Press, 2008, pp. 208-607.
2. J.J. Dabrowski and R.M. Ramzan, "Built-in Loopback Test for IC RF Transceivers," IEEE Trans. VLSI Systems, vol. 18, no. 6, 2010, pp. 933-946.
3. G. Srinivasan, F. Taenzler, and A. Chatterjee, "Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers," IEEE Design and Test, vol. 25, no. 2, 2008, pp. 150-159.
4. A. Valdes-Garcia, J. Silva-Martinez, and E. Sanchez-Sinencio, "On-Chip Testing Techniques for RF Wireless Transceivers," IEEE Design and Test, vol. 23, no. 4, 2006, pp. 268-277.
5. L. Jin et al., "Testing of Precision DACs Using Low-Resolution ADCs with Dithering," Proc. IEEE Int'l Test Conf. (ITC 06), IEEE CS Press, 2006, doi 10.1109/TEST.2006.297628.
6. K. Muhammad, R.B. Staszewski, and D. Leipold, "Digital RF Processing: Toward Low-Cost Reconfigurable Radios," IEEE Comm., vol. 43, no. 8, 2005, pp. 105-111.
7. O. Eliezer et al., "Built-in Self Testing of a DRP-Based GSM Transmitter," Proc. IEEE RFIC Symp., IEEE Press, 2007, pp. 339-342.
8. J. Craninckx and M. Steyaert, "Low-Noise Voltage Controlled Oscillators Using Enhanced LC-Tanks," IEEE Trans. Circuits and Systems II, vol. 42, no. 12, 1995, pp. 794-904.
9. D. Webster et al., "A Novel RF Phase Error Built-in-Self-Test for GSM," Proc. 9th Int'l Conf. Solid-State and Integrated-Circuit Technology (ISCICT 08), IEEE Press, 2008, pp. 2075-2078.
10. D. Webster et al., "Novel BIST Methods for Parametric Test in Wireless Transceivers," Proc. IEEE 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, IEEE Press, 2010, pp. 112-115.
11. A. Georgiadis, "Gain, Phase Imbalance, and Phase Noise Effects on Error Vector Magnitude," IEEE Trans. Vehicular Technology, vol. 53, no. 2, 2004, pp. 443-449.
12. S. Sunter and A. Roy, "On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz," IEEE Design & Test, vol. 21, no. 4, 2004, pp. 314-321.
13. K. Dufrene, Z. Boos, and R. Weigel, "Digital Adaptive IIP2 Calibration Scheme for CMOS Downconversion Mixers," IEEE J. Solid-State Circuits, vol. 43, no. 11, 2008, pp. 2434-2445.
14. H.-G. Stratigopoulos, S. Mir, and A. Bounceur, "Evaluation of Analog/RF Test Measurements at the Design Stage," IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems," vol. 28, no. 4, 2009, pp. 582-590.
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