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Issue No. 06 - Nov.-Dec. (2011 vol. 28)
ISSN: 0740-7475
pp: 66-75
Rick Hudgens , Texas Instruments
Dallas L. Webster , Texas Instruments
Donald Lie , Texas Tech University
ABSTRACT
<p>RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100% of EVM failures during production of over a million devices, which presents significant opportunities for both cost and time savings.</p>
INDEX TERMS
design and test, BIST, CMOS integrated circuits, EVM, production test, RF-BIST, RF-SoC, self-calibration, self-testing, SoC, wireless LAN
CITATION
Rick Hudgens, Dallas L. Webster, Donald Lie, "Replacing Error Vector Magnitude Test with RF and Analog BISTs", IEEE Design & Test of Computers, vol. 28, no. , pp. 66-75, Nov.-Dec. 2011, doi:10.1109/MDT.2011.1
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