Issue No. 06 - Nov.-Dec. (2011 vol. 28)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2011.118
Peter Maxwell , Aptina
<p>This article describes the development of adaptive testing in response to the ever-growing need to dynamically and cost-effectively tailor IC testing to discriminately manage manufacturing process variations. Various degrees of adoption are presented, together with benefits and examples of its use. Finally, challenges for future development are discussed.</p>
design and test, variability, statistical data analysis, test flow, real-time analysis
P. Maxwell, "Adaptive Testing: Dealing with Process Variability," in IEEE Design & Test of Computers, vol. 28, no. , pp. 41-49, 2011.