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Issue No. 06 - Nov.-Dec. (2011 vol. 28)
ISSN: 0740-7475
pp: 8-15
Tsung-Ching Huang , University of Tokyo
Jiun-Lang Huang , National Taiwan University
Kwang-Ting (Tim) Cheng , University of California at Santa Barbara
<p>Editor's note:</p><p>In this review article, the authors survey several thin-film transistor (TFT) technologies for flexible electronics of the future. The review's focus centers on the reliability issues of these new devices compared to those of classic silicon CMOS. In addition, the article examines different digital and analog design techniques, which are discussed within the context of robust circuit design.</p><p align="right">&#x2014;Dimitris Gizopoulos, IEEE Design &#x0026; Test Tutorial Articles Department Editor; University of Athens</p>
design and test, thin film transistors, flexible electronics

T. Huang, J. Huang and K. (. Cheng, "Robust Circuit Design for Flexible Electronics," in IEEE Design & Test of Computers, vol. 28, no. , pp. 8-15, 2011.
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