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Issue No. 03 - May/June (2011 vol. 28)
ISSN: 0740-7475
pp: 84-85
ABSTRACT
<p>Panel Summaries reports on two ITC 2010 panels: "Concurrent Test Supported by DFT Techniques" and "ATE Companies and How Smart Does Our Silicon Need To Be?".</p>
INDEX TERMS
design and test, ATE, DFT, ITC 2010, ITC panels
CITATION
"Panel Summaries", IEEE Design & Test of Computers, vol. 28, no. , pp. 84-85, May/June 2011, doi:10.1109/MDT.2011.64
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