Issue No. 03 - May/June (2011 vol. 28)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2011.57
<p>Conference Reports features the second <scp>IEEE</scp> International Workshop on Reliability Aware System Design and Test (RASDAT),which was held in conjunction with the 24th International Conference on VLSI Design.</p>
design and test, RASDAT
"Conference Reports," in IEEE Design & Test of Computers, vol. 28, no. , pp. 82-83, 2011.