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Issue No. 03 - May/June (2011 vol. 28)
ISSN: 0740-7475
pp: 82-83
ABSTRACT
<p>Conference Reports features the second <scp>IEEE</scp> International Workshop on Reliability Aware System Design and Test (RASDAT),which was held in conjunction with the 24th International Conference on VLSI Design.</p>
INDEX TERMS
design and test, RASDAT
CITATION
"Conference Reports", IEEE Design & Test of Computers, vol. 28, no. , pp. 82-83, May/June 2011, doi:10.1109/MDT.2011.57
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